Automated Test Summit 2011 – Agenda and Presentation Abstracts are Available

Automated Test Summit - 13 April, 2011 - Budapest
Agenda and Presentation Abstracts are Available!

National Instruments is proud to host 2nd Eastern European Automated Test Summit. This free, one-day conference is dedicated for engineers developing and testing state-of-the-art products in virtually any domain. Tested products range from white goods, to the latest consumer electronics such as TV sets and set-to-boxes to high-tech electronics for civil and military transportation systems such as avionic radio transponders, automotive multimedia systems or electronic control units.
» ni.com/country/automatedtest

Summit Highlights

Presentations: System integrators, end users and NI engineers will present on various topics.
More details below.
Expo area: Demonstration of National Instruments products and partner solutions
Know-How: Learning about methods and platforms for reducing the overall cost of test and for accelerating test development for products and systems of any complexity.
Networking: Meet with colleagues from your industry.
TestStand Exam: Certified TestStand Developer (CTD) exam free of charge. More details below.
LabVIEW Exam:Certified LabVIEW Associate Developer (CLAD) exam free of charge. More details below.

Agenda and Presentation Abstracts are Available!

Presentations

• Software defined test system architectures

• Newest technologies in RF testing like peer-to-peer streaming and signal processing on FPGA (Field
Programmable Gate Array) chips

• Optimizing execution time of test sequences developed in industry-standard TestStand environment

• Real-time tests with FPGA devices and dedicated software tools

• Specialized test steps for Audio/Video testing

• High-resolution, high-speed and multipoint measurements systems

• Automated vision systems for mechanical defects of elements/parts

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A Comprehensive View of Key Technologies and Methodologies in Test and Measurement Industry.

Time	Topic	Presenter
9:00	Keynote:	National Instruments
9:45	Measurement As a First Step for Ensuring Your Product Quality » Learn more	National Instruments
10:20
10:55	Coffe Break
11:10
11:45	FPGA in Real-Time and/or high-performance Testing » Learn more	National Instruments
12:20	Lunch
13:20
13:55
14:30
15:05	Coffee Break
15:20	How to Shorten Development and Execution Time of Your Test? » Learn more	National Instruments
16:20
16:55	Free of charge TestStand Exam (CTD) or LabVIEW Exam (CLAD). Register to the CTD or CLAD exams by sending an email to register.country@ni.com.

Automated Test Summit at 11 locations in 2011
The NI Automated Test Summit 2011 will be visiting 11 cities in Eastern Europe. Join us in one of these cities to benefit from the comprehensive program it offers for you.
» I like it! I will be there!

Free of charge exams
All event attendees are entitled for taking part in Certified TestStand Developer (CTD) or Certified LabVIEW Associate Developer (CLAD) exams free of charge. These exams prove the understanding of core features and functionality of industry standard NI TestStand or NI LabVIEW environments.

Register to the CTD or CLAD exams by sending an email to register.country@ni.com. Provide please in the email your name, company name and phone number and specify which exams you are interested in.
Should you have any questions about the CTD or CLAD exams call 080 xxx.

Automated Test Summit - ni.com/country/automatedtest
Budapest – 13 April, 2011 - Like! I will be there!

Presenters:

Media Partners:

For more information about the event visit: » ni.com/country/automatedtest